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- 品牌/型号：梅特勒/XP205
- 类型：精密天平仪器
- 加工定制：否
- 最小称量：0.01（mg）mg
- 最大称量：220（g）g
云南昆明优价销售梅特勒天平
XP205 分析天平
| 最大称量范围 | 220 g |
| 可读性 | 0.01 mg |
| Linearity | 0.1 mg |
| Repeatability | 0.015 - 0.03 mg |
| Sensitivity temperature drift | 1 x 10^-6/°C •Rnt |
| Size of weighing pan | 78 x 73 mm |
| Taring range | 0...220 g |
| Sensitivity Accuracy | 2.0 x 10^-6 •Rnt |
| Sensitivity Stability | 1 x 10^-6/a •Rnt |
| Settling Time | 1.5 s |
| Usable height of draft shield | 235 mm |
| Adjustment with external weights | 用户砝码 |
| Adjustment with internal weights | ProFACT专业全自动校准技术专业级全自动校准技术, 温度漂移和时间触发的全自动内校 |
| Dimensions | 263x487x322 mm (WxDxH) |
| Interfaces | RS-232C |
| Minimum weigh (typical acc. USP) | 21 mg |
| Minimum weigh (typical, U=1%, sd=2) | 1.4 mg |
| Sensitivity offset | 2x10-6·Rnt |
| 标准特性: | 所有型号均提供: | ||||||||||||||||||||||
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